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ISTQB CT-AI Exam Syllabus Topics:

Topic	Details
Topic 1	Testing AI-Specific Quality Characteristics: In this section, the topics covered are about the challenges in testing created by the self-learning of AI-based systems.
Topic 2	Test Environments for AI-Based Systems: This section is about factors that differentiate the test environments for AI-based
Topic 3	Quality Characteristics for AI-Based Systems: This section covers topics covered how to explain the importance of flexibility and adaptability as characteristics of AI-based systems and describes the vitality of managing evolution for AI-based systems. It also covers how to recall the characteristics that make it difficult to use AI-based systems in safety-related applications.
Topic 4	Testing AI-Based Systems Overview: In this section, focus is given to how system specifications for AI-based systems can create challenges in testing and explain automation bias and how this affects testing.
Topic 5	Machine Learning ML: This section includes the classification and regression as part of supervised learning, explaining the factors involved in the selection of ML algorithms, and demonstrating underfitting and overfitting.
Topic 6	Methods and Techniques for the Testing of AI-Based Systems: In this section, the focus is on explaining how the testing of ML systems can help prevent adversarial attacks and data poisoning.
Topic 7	systems from those required for conventional systems.
Topic 8	ML Functional Performance Metrics: In this section, the topics covered include how to calculate the ML functional performance metrics from a given set of confusion matrices.
Topic 9	Neural Networks and Testing: This section of the exam covers defining the structure and function of a neural network including a DNN and the different coverage measures for neural networks.
Topic 10	ML: Data: This section of the exam covers explaining the activities and challenges related to data preparation. It also covers how to test datasets create an ML model and recognize how poor data quality can cause problems with the resultant ML model.

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ISTQB Certified Tester AI Testing Exam Sample Questions (Q32-Q37):

NEW QUESTION # 32
Which ONE of the following describes a situation of back-to-back testing the LEAST?
SELECT ONE OPTION

A. Comparison of the results of the current neural network ML model on the current data set with a slightly modified data set.
B. Comparison of the results of a neural network ML model with a current decision tree ML model for the same data.
C. Comparison of the results of a current neural network model ML model implemented in platform A (for example Pytorch) with a similar neural network model ML model implemented in platform B (for example Tensorflow), for the same data.
D. Comparison of the results of a home-grown neural network model ML model with results in a neural network model implemented in a standard implementation (for example Pytorch) for same data

Answer: B

Explanation:
Back-to-back testing is a method where the same set of tests are run on multiple implementations of the system to compare their outputs. This type of testing is typically used to ensure consistency and correctness by comparing the outputs of different implementations under identical conditions. Let's analyze the options given:
A . Comparison of the results of a current neural network model ML model implemented in platform A (for example Pytorch) with a similar neural network model ML model implemented in platform B (for example Tensorflow), for the same data.
This option describes a scenario where two different implementations of the same type of model are being compared using the same dataset. This is a typical back-to-back testing situation.
B . Comparison of the results of a home-grown neural network model ML model with results in a neural network model implemented in a standard implementation (for example Pytorch) for the same data.
This option involves comparing a custom implementation with a standard implementation, which is also a typical back-to-back testing scenario to validate the custom model against a known benchmark.
C . Comparison of the results of a neural network ML model with a current decision tree ML model for the same data.
This option involves comparing two different types of models (a neural network and a decision tree). This is not a typical scenario for back-to-back testing because the models are inherently different and would not be expected to produce identical results even on the same data.
D . Comparison of the results of the current neural network ML model on the current data set with a slightly modified data set.
This option involves comparing the outputs of the same model on slightly different datasets. This could be seen as a form of robustness testing or sensitivity analysis, but not typical back-to-back testing as it doesn't involve comparing multiple implementations.
Based on this analysis, option C is the one that describes a situation of back-to-back testing the least because it compares two fundamentally different models, which is not the intent of back-to-back testing.

NEW QUESTION # 33
There is a growing backlog of unresolved defects for your project. You know the developers have an ML model that they have created which has learned which developers work on which type of software and the speed with which they resolve issues. How could you use this model to help reduce the backlog and implement more efficient defect resolution?

A. Use it to review the code and determine where more defects are likely to occur so that testing can be targeted to those areas.
B. Use it to determine the root cause of each defect and develop a process improvement plan that can be implemented to remove the most common root causes.
C. Use it to assign defects to the best developer to resolve the problem and to load balance the defect assignments among the developers.
D. Use it to prioritize defects automatically based on the time expected for the fix to be made, the speed of the fix, and the likelihood of regressions.

Answer: C

Explanation:
AI and ML models can play a significant role in optimizing defect resolution processes. According to the ISTQB Certified Tester AI Testing (CT-AI) Syllabus, ML models can be used toanalyze defect reports, prioritize critical defects, and assign defects to developersbased on historical defect resolution patterns.
The key AI applications for defect management include:
* Defect Categorization- NLP techniques can analyze defect reports and classify them based on metadata like severity and impact.
* Defect Prioritization- ML models trained on past defects can predict which issues are likely to cause failures, allowing teams toprioritizethe most critical issues.
* Defect Assignment- AI-based models can suggest which developers are best suited for specific defects, optimizing the resolution process based on past performance and specialization.
From the given answer choices:
* Option A (Automatic Prioritization)is useful but does not directlyreduce backlog efficientlyby considering developer expertise and workload balancing.
* Option C (Root Cause Analysis for Process Improvement)is along-term strategybut does not directly address backlog reduction.
* Option D (Defect Prediction for Testing Focus)helps preemptively identify issues but does not resolve the existing backlog.
Thus,Option Bis the best choice as it aligns with AI's capability toassign defects to the most suitable developersbased on historical data, ensuring efficient defect resolution and backlog reduction.
Certified Tester AI Testing Study Guide References:
* ISTQB CT-AI Syllabus v1.0, Section 11.2 (Using AI to Analyze Reported Defects)
* ISTQB CT-AI Syllabus v1.0, Section 11.5 (Using AI for Defect Prediction).

NEW QUESTION # 34
Which of the following is one of the reasons for data mislabelling?

A. Lack of domain knowledge
B. Expert knowledge
C. Interoperability error
D. Small datasets

Answer: A

Explanation:
Data mislabeling occurs for several reasons, which can significantly impact the performance of machine learning (ML) models, especially in supervised learning. According to the ISTQB Certified Tester AI Testing (CT-AI) syllabus, mislabeling of data can be caused by the following factors:
* Random errors by annotators- Mistakes made due to accidental misclassification.
* Systemic errors- Errors introduced by incorrect labeling instructions or poor training of annotators.
* Deliberate errors- Errors introduced intentionally by malicious data annotators.
* Translation errors- Occur when correctly labeled data in one language is incorrectly translated into another language.
* Subjectivity in labeling- Some labeling tasks require subjective judgment, leading to inconsistencies between different annotators.
* Lack of domain knowledge- If annotators do not have sufficient expertise in the domain, they may label data incorrectly due to misunderstanding the context.
* Complex classification tasks- The more complex the task, the higher the probability of labeling mistakes.
Among the answer choices provided, "Lack of domain knowledge" (Option A) is the best answer because expertise is essential to accurately labeling data in complex domains such as medical, legal, or engineering fields.
Certified Tester AI Testing Study Guide References:
* ISTQB CT-AI Syllabus v1.0, Section 4.5.2 (Mislabeled Data in Datasets)
* ISTQB CT-AI Syllabus v1.0, Section 4.3 (Dataset Quality Issues)

NEW QUESTION # 35
You are testing an autonomous vehicle which uses AI to determine proper driving actions and responses. You have evaluated the parameters and combinations to be tested and have determinedthat there are too many to test in the time allowed. It has been suggested that you use pairwise testing to limit the parameters. Given the complexity of the software under test, what is likely the outcome from using pairwise testing?

A. While the number of tests needed can be reduced, there may still be a large enough set of tests that automation will be required to execute all of them.
B. Pairwise cannot be applied to this problem because there is AI involved and the evolving values may result in unexpected results that cannot be verified.
C. All high priority defects will be identified using this method.
D. The number of parameters to test can be reduced to less than a dozen.

Answer: A

Explanation:
Pairwise testing is a combinatorial testing technique that reduces the number of test cases by focusing on testing interactions between pairs of parameters rather than all possible combinations. It is widely used in AI- based systems, including autonomous vehicles, where the number of possible input parameter combinations can be extremely high.
* Option A:"The number of parameters to test can be reduced to less than a dozen."
* This is incorrect. While pairwise testing significantly reduces the number of test cases, it does not necessarily limit them to a fixed number like a dozen. The final number of tests depends on the number of parameters and their possible values.
* Option B:"All high priority defects will be identified using this method."
* This is incorrect. While pairwise testing is effective in detecting defects caused by interactions between two parameters, it may not uncover defects resulting from more complex interactions involving three or more parameters.
* Option C:"While the number of tests needed can be reduced, there may still be a large enough set of tests that automation will be required to execute all of them."
* This is the correct answer. Even though pairwise testing reduces the number of test cases, AI- based systems such as autonomous vehicles still have a large number of test scenarios. Therefore, automation is often necessary to execute all test cases within the available time.
* Option D:"Pairwise cannot be applied to this problem because there is AI involved, and the evolving values may result in unexpected results that cannot be verified."
* This is incorrect. Pairwise testing can still be applied to AI-based systems, including those that evolve over time. However, additional testing techniques may be required to verify evolving behavior.
* Pairwise Testing for AI Systems:"Pairwise testing is widely used because it effectively reduces the number of test cases while maintaining defect detection capability".
* Automation Requirement:"In practice, even with pairwise testing, extensive test suites may still require automation".
Analysis of the Answer Options:ISTQB CT-AI Syllabus References:

NEW QUESTION # 36
Which ONE of the following statements correctly describes the importance of flexibility for Al systems?
SELECT ONE OPTION

A. Al systems are inherently flexible.
B. Al systems require changing of operational environments; therefore, flexibility is required.
C. Flexible Al systems allow for easier modification of the system as a whole.
D. Self-learning systems are expected to deal with new situations without explicitly having to program for it.

Answer: C

Explanation:
Flexibility in AI systems is crucial for various reasons, particularly because it allows for easier modification and adaptation of the system as a whole.
* AI systems are inherently flexible (A): This statement is not correct. While some AI systems may be designed to be flexible, they are not inherently flexible by nature. Flexibility depends on the system's design and implementation.
* AI systems require changing operational environments; therefore, flexibility is required (B):
While it's true that AI systems may need to operate in changing environments, this statement does not directly address the importance of flexibility for the modification of the system.
* Flexible AI systems allow for easier modification of the system as a whole (C): This statement correctly describes the importance of flexibility. Being able to modify AI systems easily is critical for their maintenance, adaptation to new requirements, and improvement.
* Self-learning systems are expected to deal with new situations without explicitly having to program for it (D): This statement relates to the adaptability of self-learning systems rather than their overall flexibility for modification.
Hence, the correct answer isC. Flexible AI systems allow for easier modification of the system as a whole.
References:
* ISTQB CT-AI Syllabus Section 2.1 on Flexibility and Adaptability discusses the importance of flexibility in AI systems and how it enables easier modification and adaptability to new situations.
* Sample Exam Questions document, Question #30 highlights the importance of flexibility in AI systems.

NEW QUESTION # 37
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